NEW DELHI, INDIA, Feb. 6, 2017 – Professionals across India would benefit from an improvement in the fairness and validity of exams, according to Gary Gates, a senior executive at global computer-based testing company Pearson VUE.
Dr Gates, senior vice president – global business at Pearson VUE, said: “India has experienced rapid economic growth for some time now, and competitive professionals are keen to gain qualifications across professions such as law, healthcare and accounting. But in order for them to succeed and for qualifications to be recognised on a global scale, exam standards must improve.
“There have been media reports about issues involving the quality and validity of exams – along with prominent cases of exam fraud – and the best way to combat this is by developing valid, fair and reliable exams according to global assessment best practices.”
To help guide exam owners in applying these best practices to their own programmes, Dr Gates and Divyalok Sharma, senior director – client development at Pearson VUE India, will be hosting a special event on how to raise India’s assessment standards.
Mr Sharma said: “India is a success story in terms of professional assessment, but clearly much more can be done to raise standards. There are concerns about the effectiveness of a test in fulfilling the primary objective of being a legally defensible measure of a specific competence. It is crucial to address the challenges test owners in India face to meet the 21st century assessment needs of professionals, and through the application of measurement science and now computer-based testing, this can be achieved.”
Topics to be discussed at the event will include how to develop a fair, valid and reliable exam, as well as security, transitioning from pen-and-paper to computer-based testing and the New Age Examination platform.
The event, Improving India’s exam standards through global best practices, takes place at the India Habitat Centre, New Delhi on 23rd February at 8:30am. See the website http://bit.ly/2jF2umw for further details.